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Frequency Dependence Measurements of Surface Resistance of Superconductors Using Four Modes in a Sapphire Rod Resonator(Special Issue on Microwave and Millimeter Wave Technology)
https://sucra.repo.nii.ac.jp/records/12861
https://sucra.repo.nii.ac.jp/records/128614af2b7d9-f220-4b1e-a3dd-7b6f1114c808
名前 / ファイル | ライセンス | アクション |
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A1003047.pdf (1.5 MB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2007-10-04 | |||||
タイトル | ||||||
タイトル | Frequency Dependence Measurements of Surface Resistance of Superconductors Using Four Modes in a Sapphire Rod Resonator(Special Issue on Microwave and Millimeter Wave Technology) | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | high-T_c superconductors | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | microwave | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | surface resistance | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | frequency dependence | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
HASHIMOTO, Toru
× HASHIMOTO, Toru× 小林, 禧夫 |
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著者 ローマ字 | ||||||
HASHIMOTO, Toru | ||||||
著者 ローマ字 | ||||||
KOBAYASHI, Yoshio | ||||||
著者 所属 | ||||||
埼玉大学 | ||||||
著者 所属 | ||||||
埼玉大学 | ||||||
著者 所属(別言語) | ||||||
Saitama University | ||||||
著者 所属(別言語) | ||||||
Saitama University | ||||||
書誌情報 |
IEICE transactions on electronics 巻 E86-C, 号 8, p. 1721-1728, 発行日 2003 |
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年月次 | ||||||
2003-8 | ||||||
出版者名 | ||||||
出版者 | 社団法人電子情報通信学会 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 09168516 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | The frequency dependence of surface resistance R_s of high temperature superconductor (HTS) films are measured by a novel measurement method using four TE_<0mp> modes in a sapphire rod resonator. At first, a loss tangent tan δ of the sapphire rod and R_s of the HTS films are evaluated separately from the results measured for the TE_<021> and TE_<012 >modes with close resonant frequencies. Secondly, R_s values at two different resonant frequencies for the TE_<011> and TE_<022> modes are measured using a well-known relation for sapphire tan δ/f = constant, where f is a frequency. R_s values of HoBa_2Cu_3O_<7-x> thin films were measured in the frequency range of 10 to 43 GHz by using four sapphire rod resonators with different sizes. As a result, it is found that these measured results of R_s have a characteristic of frequency square. | |||||
注記 | ||||||
内容記述タイプ | Other | |||||
内容記述 | copyright(c)2003 IEICE 許諾番号:07RB0174 http://www.ieice.org/jpn/trans_online/index.html |
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資源タイプ | ||||||
内容記述タイプ | Other | |||||
内容記述 | text | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
作成日 | ||||||
日付 | 2007-10-04 | |||||
日付タイプ | Created | |||||
アイテムID | ||||||
A1003047 |