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In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO2 substrates
https://sucra.repo.nii.ac.jp/records/12948
https://sucra.repo.nii.ac.jp/records/129481145ac32-ea4c-404b-b881-4298fbf6b3c8
名前 / ファイル | ライセンス | アクション |
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A1002282.pdf (263.4 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2007-10-30 | |||||
タイトル | ||||||
タイトル | In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO2 substrates | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Pentacene | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | In-situ characterization | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Atomic force microscopy | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Near edge extended X-ray absorption fine structure (NEXAFS) | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Surface structure,morphology,roughness,and topography | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Silicon oxides | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Aromatics | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Thin film structures | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Yoshikawa, Genki
× Yoshikawa, Genki× Miyadera, Tetsuhiko× Onoki, Ryo× 上野, 啓司× Nakai, Ikuyo× Entani, Shiro× Ikeda, Susumu× Guo, Dong× Kiguchi, Manabu× Kondoh, Hiroshi× Ohta, Toshiaki× Saiki, Koichiro |
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著者 ローマ字 | ||||||
Yoshikawa, Genki | ||||||
著者 ローマ字 | ||||||
Miyadera, Tetsuhiko | ||||||
著者 ローマ字 | ||||||
Onoki, Ryo | ||||||
著者 ローマ字 | ||||||
Ueno, Keiji | ||||||
著者 ローマ字 | ||||||
Nakai, Ikuyo | ||||||
著者 ローマ字 | ||||||
Entani, Shiro | ||||||
著者 ローマ字 | ||||||
Ikeda, Susumu | ||||||
著者 ローマ字 | ||||||
Guo, Dong | ||||||
著者 ローマ字 | ||||||
Kiguchi, Manabu | ||||||
著者 ローマ字 | ||||||
Kondoh, Hiroshi | ||||||
著者 ローマ字 | ||||||
Ohta, Toshiaki | ||||||
著者 ローマ字 | ||||||
Saiki, Koichiro | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
埼玉大学大学院理工学研究科 | ||||||
著者 所属 | ||||||
埼玉大学大学院理工学研究科物質科学部門物質機能領域 | ||||||
著者 所属(別言語) | ||||||
著者 所属(別言語) | ||||||
著者 所属(別言語) | ||||||
Department of Chemistry, Faculty of Science, Saitama University | ||||||
著者 所属(別言語) | ||||||
Department of Chemistry, Faculty of Science, Saitama University | ||||||
書誌情報 |
SURFACE SCIENCE 巻 600, 号 12, p. 2518-2522, 発行日 2006 |
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年月次 | ||||||
2006-1 | ||||||
出版者名 | ||||||
出版者 | Elsevier Science B.V., | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 00396028 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | info:doi/10.1016/j.susc.2006.04.012 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Molecular orientations of pentacene ultrathin films grown on SiO2 substrates were studied without the influence of the atmosphere by vacuum atomic force microscopy (V-AFM) and near edge X-ray absorption fine structure (NEXAFS). The experimental processes from deposition of pentacene to characterization of films were performed under vacuum condition without exposure to the atmosphere. V-AFM and NEXAFS measurements showed that pentacene molecules tend to grow on SiO2 surface with their molecular long axes perpendicular to the substrate surfaces (standing-mode) irrespective of preparation procedure of SiO2 substrate. (c) 2006 Elsevier B.V. All rights reserved. | |||||
注記 | ||||||
内容記述タイプ | Other | |||||
内容記述 | http://www.sciencedirect.com/science/journal/00396028 | |||||
版 | ||||||
[著者版] | ||||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
資源タイプ | ||||||
内容記述タイプ | Other | |||||
内容記述 | text | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
作成日 | ||||||
日付 | 2007-10-29 | |||||
日付タイプ | Created | |||||
アイテムID | ||||||
A1002282 |