WEKO3
アイテム
{"_buckets": {"deposit": "ab3d65ae-bea4-444f-ad2b-14517b70dccb"}, "_deposit": {"created_by": 3, "id": "12879", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "12879"}, "status": "published"}, "_oai": {"id": "oai:sucra.repo.nii.ac.jp:00012879", "sets": ["426"]}, "author_link": ["20306"], "item_119_biblio_info_8": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2004", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "5", "bibliographicPageEnd": "656", "bibliographicPageStart": "652", "bibliographicVolumeNumber": "E87-C", "bibliographic_titles": [{"bibliographic_title": "IEICE transactions on electronics"}]}]}, "item_119_date_31": {"attribute_name": "作成日", "attribute_value_mlt": [{"subitem_date_issued_datetime": "2007-10-04", "subitem_date_issued_type": "Created"}]}, "item_119_description_17": {"attribute_name": "関連サイト", "attribute_value_mlt": [{"subitem_description": "http://www.ieice.org/jpn/trans_online/index.html | http://www.ieice.org/jpn/trans_online/index.html", "subitem_description_type": "Other"}]}, "item_119_description_19": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture super-conductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties.", "subitem_description_type": "Abstract"}]}, "item_119_description_21": {"attribute_name": "注記", "attribute_value_mlt": [{"subitem_description": "copyright(c)2004 IEICE\n許諾番号:07RB0174", "subitem_description_type": "Other"}]}, "item_119_description_29": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"subitem_description": "text", "subitem_description_type": "Other"}]}, "item_119_description_30": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_description": "application/pdf", "subitem_description_type": "Other"}]}, "item_119_publisher_11": {"attribute_name": "出版者名", "attribute_value_mlt": [{"subitem_publisher": "社団法人電子情報通信学会"}]}, "item_119_source_id_14": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "09168516", "subitem_source_identifier_type": "ISSN"}]}, "item_119_text_3": {"attribute_name": "著者 ローマ字", "attribute_value_mlt": [{"subitem_text_value": "KOBAYASHI, Yoshio"}]}, "item_119_text_32": {"attribute_name": "アイテムID", "attribute_value_mlt": [{"subitem_text_value": "A1003046"}]}, "item_119_text_35": {"attribute_name": "公開日(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "Oct 4, 2007 09:00:00"}]}, "item_119_text_36": {"attribute_name": "最終更新日(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "Oct 10, 2008 17:29:57"}]}, "item_119_text_37": {"attribute_name": "更新履歴(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "Oct 10, 2008 フリーキーワード, インデックス, キーワード を変更"}, {"subitem_text_value": "Sep 22, 2008 コメント, フリーキーワード, キーワード を変更"}, {"subitem_text_value": "Feb 28, 2008 フリーキーワード, インデックス, キーワード を変更"}, {"subitem_text_value": "Feb 14, 2008 フリーキーワード, インデックス, キーワード を変更"}, {"subitem_text_value": "Oct 20, 2007 フリーキーワード, インデックス, キーワード を変更"}, {"subitem_text_value": "Oct 12, 2007 フリーキーワード, キーワード を変更"}, {"subitem_text_value": "Oct 5, 2007 コメント, ID, フリーキーワード, インデックス, キーワード を変更"}]}, "item_119_text_38": {"attribute_name": "登録者(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "sucra_jim4"}]}, "item_119_text_39": {"attribute_name": "閲覧数(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "930"}]}, "item_119_text_4": {"attribute_name": "著者 所属", "attribute_value_mlt": [{"subitem_text_value": "埼玉大学"}]}, "item_119_text_40": {"attribute_name": "ダウンロード数(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "2222"}]}, "item_119_text_41": {"attribute_name": "XooNIps_インデックス", "attribute_value_mlt": [{"subitem_text_value": "sucra_jim4|Public/埼玉大学/理工学研究科|Public/埼玉大学/理工学研究科/数理電子情報部門|Public/主題別/工学/電気電子工学/電子・電気材料工学|Public/ジャンル別/学術雑誌論文(国内)/電子情報通信学会"}]}, "item_119_text_42": {"attribute_name": "XooNIps_ITEM_KEY", "attribute_value_mlt": [{"subitem_text_value": "831"}]}, "item_119_text_5": {"attribute_name": "著者 所属(別言語)", "attribute_value_mlt": [{"subitem_text_value": "Saitama University"}]}, "item_119_text_9": {"attribute_name": "年月次", "attribute_value_mlt": [{"subitem_text_value": "2004-5"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "小林, 禧夫"}, {"creatorName": "コバヤシ, ヨシオ", "creatorNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "20306", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-01-24"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "A1003046.pdf", "filesize": [{"value": "464.4 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 464400.0, "url": {"label": "A1003046.pdf", "url": "https://sucra.repo.nii.ac.jp/record/12879/files/A1003046.pdf"}, "version_id": "744bb916-f080-4a3a-bb62-b30ee48dab58"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "microwave", "subitem_subject_scheme": "Other"}, {"subitem_subject": "millimeter wave", "subitem_subject_scheme": "Other"}, {"subitem_subject": "standardization", "subitem_subject_scheme": "Other"}, {"subitem_subject": "low-loss dielectric", "subitem_subject_scheme": "Other"}, {"subitem_subject": "high-temperature superconductor", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(\u003cSpecial Section\u003eAdvances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(\u003cSpecial Section\u003eAdvances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)"}]}, "item_type_id": "119", "owner": "3", "path": ["426"], "permalink_uri": "https://sucra.repo.nii.ac.jp/records/12879", "pubdate": {"attribute_name": "公開日", "attribute_value": "2007-10-04"}, "publish_date": "2007-10-04", "publish_status": "0", "recid": "12879", "relation": {}, "relation_version_is_last": true, "title": ["Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(\u003cSpecial Section\u003eAdvances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)"], "weko_shared_id": -1}
Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
https://sucra.repo.nii.ac.jp/records/12879
https://sucra.repo.nii.ac.jp/records/1287993ce352c-793a-4796-ba60-ed3741a71cc8
名前 / ファイル | ライセンス | アクション |
---|---|---|
A1003046.pdf (464.4 kB)
|
|
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2007-10-04 | |||||
タイトル | ||||||
タイトル | Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits) | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | microwave | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | millimeter wave | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | standardization | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | low-loss dielectric | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | high-temperature superconductor | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
小林, 禧夫
× 小林, 禧夫 |
|||||
著者 ローマ字 | ||||||
KOBAYASHI, Yoshio | ||||||
著者 所属 | ||||||
埼玉大学 | ||||||
著者 所属(別言語) | ||||||
Saitama University | ||||||
書誌情報 |
IEICE transactions on electronics 巻 E87-C, 号 5, p. 652-656, 発行日 2004 |
|||||
年月次 | ||||||
2004-5 | ||||||
出版者名 | ||||||
出版者 | 社団法人電子情報通信学会 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 09168516 | |||||
関連サイト | ||||||
内容記述タイプ | Other | |||||
内容記述 | http://www.ieice.org/jpn/trans_online/index.html | http://www.ieice.org/jpn/trans_online/index.html | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture super-conductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties. | |||||
注記 | ||||||
内容記述タイプ | Other | |||||
内容記述 | copyright(c)2004 IEICE 許諾番号:07RB0174 |
|||||
資源タイプ | ||||||
内容記述タイプ | Other | |||||
内容記述 | text | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
作成日 | ||||||
日付 | 2007-10-04 | |||||
日付タイプ | Created | |||||
アイテムID | ||||||
A1003046 |