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Highly sensitive reflection high-energy electron diffraction measurement by use of micro-channel imaging plate
https://sucra.repo.nii.ac.jp/records/13220
https://sucra.repo.nii.ac.jp/records/13220db4d30c5-87ee-4c69-9c73-fb05d75bac0c
名前 / ファイル | ライセンス | アクション |
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A1002598.pdf (83.2 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2008-04-11 | |||||
タイトル | ||||||
タイトル | Highly sensitive reflection high-energy electron diffraction measurement by use of micro-channel imaging plate | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
斉木, 幸一朗
× 斉木, 幸一朗× Kono, Takaomi× 上野, 啓司× 小間, 篤 |
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著者 ローマ字 | ||||||
Saiki, Koichiro | ||||||
著者 ローマ字 | ||||||
Kono, Takaomi | ||||||
著者 ローマ字 | ||||||
Ueno, Keiji | ||||||
著者 ローマ字 | ||||||
Koma, Atsushi | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
東京大学大学院理学系研究科化学専攻(現 : 埼玉大学大学院理工学研究科物質科学部門) | ||||||
著者 所属(別言語) | ||||||
Department of Complexity Science and Engineering, Graduate School of Frontier Sciences, University of Tokyo | ||||||
著者 所属(別言語) | ||||||
Department of Chemistry, School of Science, University of Tokyo | ||||||
著者 所属(別言語) | ||||||
Department of Chemistry, School of Science, University of Tokyo(Present : Graduate School of Science and Engineering, Saitama University) | ||||||
著者 所属(別言語) | ||||||
Department of Chemistry, School of Science, University of Tokyo | ||||||
書誌情報 |
REVIEW OF SCIENTIFIC INSTRUMENTS 巻 71, 号 9, p. 3478-3479, 発行日 2000 |
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年月次 | ||||||
2000-9 | ||||||
出版者名 | ||||||
出版者 | American Institute of Physics | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 00346748 | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | info:doi/10.1063/1.1287625 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Micro-channel plate (MCP) was used to intensify the image on the fluorescent screen in reflection high-energy electron diffraction. The primary electron current could be reduced by four orders of magnitude to get the image of the same intensity as in the measurement without MCP. The reduction of electron beam enabled observation of ionic crystal surfaces without causing electrolysis and charging effect. (C) 2000 American Institute of Physics. [S0034- 6748(00)02309-1]. | |||||
版 | ||||||
[出版社版] | ||||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
資源タイプ | ||||||
内容記述タイプ | Other | |||||
内容記述 | text | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
作成日 | ||||||
日付 | 2008-04-11 | |||||
日付タイプ | Created | |||||
アイテムID | ||||||
A1002598 |