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Molecular layer-by-layer growth of C-60 thin films by continuous-wave infrared laser deposition
https://sucra.repo.nii.ac.jp/records/13261
https://sucra.repo.nii.ac.jp/records/1326168fcef62-1e15-438c-9243-e31c05bd0700
名前 / ファイル | ライセンス | アクション |
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A1002643.pdf (430.1 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2008-05-26 | |||||
タイトル | ||||||
タイトル | Molecular layer-by-layer growth of C-60 thin films by continuous-wave infrared laser deposition | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Yaginuma, Seiichiro
× Yaginuma, Seiichiro× Itaka, Kenji× Haemori, Masamitsu× Katayama, Masao× 上野, 啓司× Ohnishi, Tsuyoshi× Lippmaa, Mikk× Matsumoto, Yuji× Koinuma, Hideomi |
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著者 ローマ字 | ||||||
Yaginuma, Seiichiro | ||||||
著者 ローマ字 | ||||||
Itaka, Kenji | ||||||
著者 ローマ字 | ||||||
Haemori, Masamitsu | ||||||
著者 ローマ字 | ||||||
Katayama, Masao | ||||||
著者 ローマ字 | ||||||
Ueno, Keiji | ||||||
著者 ローマ字 | ||||||
Ohnishi, Tsuyoshi | ||||||
著者 ローマ字 | ||||||
Lippmaa, Mikk | ||||||
著者 ローマ字 | ||||||
Matsumoto, Yuji | ||||||
著者 ローマ字 | ||||||
Koinuma, Hideomi | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
埼玉大学大学院理工学研究科物質科学部門 | ||||||
著者 所属(別言語) | ||||||
著者 所属(別言語) | ||||||
著者 所属(別言語) | ||||||
著者 所属(別言語) | ||||||
著者 所属(別言語) | ||||||
Department of Chemistry, Saitama University | ||||||
書誌情報 |
APPLIED PHYSICS EXPRESS 巻 1, 号 1, p. 015005-1-015005-3, 発行日 2008 |
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年月次 | ||||||
2008-1 | ||||||
出版者名 | ||||||
出版者 | The Japan Society of Applied Physics | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 18820778 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | info:doi/10.1143/APEX.1.015005 | |||||
関連サイト | ||||||
内容記述タイプ | Other | |||||
内容記述 | http://apex.ipap.jp/link?APEX/1/015005/ | http://apex.ipap.jp/link?APEX/1/015005/ | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | The observation of reflection high energy electron diffraction (RHEED) oscillations has been proved to be a key to open the nano-world of materials, since it definitely verifies that the film growth proceeds in layer-by-layer mode with each layer thickness controllable by simply counting the number of oscillations. This enabled the fabrication of nano-engineered hetero-junctions and devices as commonly practiced for conventional semiconductors and metals. Here we report on the first observation of clear RHEED intensity oscillation in thin film fabrication of pi-conjugated molecular solid. The observation has been achieved by coupling a novel deposition method using a continuous-wave infrared laser for evaporation and a high sensitive RHEED detector, in addition to the combinatorial optimization of film deposition parameters that facilitated our preceding first success in the layer-by-layer growth of oxide thin films. Some details of system design and experimental conditions are presented to discuss the key factors for atomically controlled film growth of molecular solids. (C) 2008 The Japan Society of Applied Physics. | |||||
版 | ||||||
[著者版] | ||||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
資源タイプ | ||||||
内容記述タイプ | Other | |||||
内容記述 | text | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
作成日 | ||||||
日付 | 2008-05-26 | |||||
日付タイプ | Created | |||||
アイテムID | ||||||
A1002643 |