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Secondary electron emission and surface charging evaluation of alumina ceramics and sapphire
https://sucra.repo.nii.ac.jp/records/13358
https://sucra.repo.nii.ac.jp/records/13358f9ca1ab7-7329-4a3d-a5fd-0208f731ccf3
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
A1002804.pdf (380.1 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2008-12-03 | |||||
| タイトル | ||||||
| タイトル | Secondary electron emission and surface charging evaluation of alumina ceramics and sapphire | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | electron emission | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | surface charging | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | high-temperature measurement | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | multipactor | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | rf window | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | alumina ceramic | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | sapphire | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| 著者 |
Suhar, yanto
× Suhar, yanto× 山納, 康× 小林, 信一 |
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| 著者 ローマ字 | ||||||
| 値 | Suharyanto | |||||
| 著者 ローマ字 | ||||||
| 値 | Yamano, Yasushi | |||||
| 著者 ローマ字 | ||||||
| 値 | Kobayashi, Shin'Ichi | |||||
| 著者 ローマ字 | ||||||
| 値 | Michizono, Shinichiro | |||||
| 著者 ローマ字 | ||||||
| 値 | Saito, Yoshio | |||||
| 著者 所属 | ||||||
| 値 | 埼玉大学大学院理工学研究科数理電子情報部門 | |||||
| 著者 所属 | ||||||
| 値 | 埼玉大学大学院理工学研究科数理電子情報部門 | |||||
| 著者 所属 | ||||||
| 値 | 埼玉大学大学院理工学研究科数理電子情報部門 | |||||
| 著者 所属(別言語) | ||||||
| 値 | Department of Electrical and Electronic Systems, Saitama University(Present : Department of Electrical Engineering, Gadjah Mada University) | |||||
| 著者 所属(別言語) | ||||||
| 値 | Department of Electrical and Electronic Systems, Saitama University | |||||
| 著者 所属(別言語) | ||||||
| 値 | Department of Electrical and Electronic Systems, Saitama University | |||||
| 著者 所属(別言語) | ||||||
| 値 | High Energy Accelerator Research Organization | |||||
| 書誌情報 |
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻 13, 号 1, p. 72-78, 発行日 2006 |
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| 年月次 | ||||||
| 値 | 2006-2 | |||||
| 出版者名 | ||||||
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |||||
| 収録物識別子 | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 10709878 | |||||
| DOI | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | info:doi/10.1109/TDEI.2006.1593403 | |||||
| 関連サイト | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | http://ieeexplore.ieee.org/search/wrapper.jsp?arnumber=1593403 | http://ieeexplore.ieee.org/search/wrapper.jsp?arnumber=1593403 | |||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | The breakdown of alumina rf windows is mostly caused by multipactor, as well as by material defects and contamination. Since multipator induces localized surface heating, leading to surface melting, it is necessary to observe secondary electron emission (SEE) coefficients of alumina ceramics under high temperature conditions. The SEE coefficients of commercial alumina ceramics and sapphire were measured by a scanning electron microscopy (SEM) with a single short-pulsed electron beam (100 pA, 1 ms) at room temperature and at 650 degrees C. Additive materials used for sintering alumina, such as SiO2 and MgO, were also investigated. Surface charging evaluations have also become important because the accumulated charges are discharged at the threshold field, resulting in surface discharge. The surface charging evaluations were carried out by multi-pulse measurements with the injection of successive pulses on the sample. As a result, reductions in the SEE coefficients with temperature were confirmed, except for sapphire. The multi-pulse measurement results indicated that surface charging of the sapphire was higher than that of other samples. This may be one of the factors that causes sapphire not to be durable for rf window applications, compared with alumina ceramics. Although there are few exceptions, it was found that the SEE coefficients of alumina ceramics increased with the purity and the average grain size. | |||||
| 版 | ||||||
| 値 | [出版社版] | |||||
| 出版タイプ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
| 資源タイプ | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | text | |||||
| フォーマット | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | application/pdf | |||||
| 作成日 | ||||||
| 日付 | 2008-12-03 | |||||
| 日付タイプ | Created | |||||
| アイテムID | ||||||
| 値 | A1002804 | |||||
