{"created":"2023-05-15T15:25:15.509075+00:00","id":12816,"links":{},"metadata":{"_buckets":{"deposit":"11837d76-99fd-4cdb-8a2f-070d4067291b"},"_deposit":{"created_by":3,"id":"12816","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"12816"},"status":"published"},"_oai":{"id":"oai:sucra.repo.nii.ac.jp:00012816","sets":["94:426"]},"author_link":["20128","20129","20133","20132","20130","20131"],"item_119_alternative_title_1":{"attribute_name":"タイトル（別言語）","attribute_value_mlt":[{"subitem_alternative_title":"Comparison of 253.7nm Irradiance Standards in Japan"}]},"item_119_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1999","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"114","bibliographicPageStart":"109","bibliographicVolumeNumber":"83","bibliographic_titles":[{"bibliographic_title":"照明学会誌"}]}]},"item_119_date_31":{"attribute_name":"作成日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2007-09-18","subitem_date_issued_type":"Created"}]},"item_119_description_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_description":"http://ci.nii.ac.jp/naid/110001144636/ | http://ci.nii.ac.jp/naid/110001144636/","subitem_description_type":"Other"}]},"item_119_description_19":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The 253.7nm irradiance standards were compared among five Japanese organizations-Sankyo Denki Co., Ltd, Toshiba Lighting & Technology Corp., Iwasaki Electric Co., Ltd., Topcon Corp., and Matsushita Electric Industrial Co., Ltd. Three of the participants calibrated their standard by optical filters and thermal detector having its absolute responsivity. Those of the other two participants were calibrated using a Si-PD, silicon photodiode, having absolute responsivity to 253.7nm line spectral irradiance. All the standards were measured with a 253.7nm irradiance transferring detector consisting of a GaAsP-photodiode and a narrow bandpass optical interference filter around 253.7nm. As a result, the 253.7nm irradiance scales of the two of the participants using thermal detector calibration and the one of them using Si-PD calibration agreed well within±1.5% deviation. The other two's scales were deviated by 5% to 10% from the average of the first three's.","subitem_description_type":"Abstract"}]},"item_119_description_21":{"attribute_name":"注記","attribute_value_mlt":[{"subitem_description":"rights: 社団法人照明学会\nrights: 本文データは学協会の許諾に基づきCiNiiから複製したものである\nrelation: isVersionOf: http://ci.nii.ac.jp/naid/110001144636/","subitem_description_type":"Other"}]},"item_119_description_29":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"text","subitem_description_type":"Other"}]},"item_119_description_30":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_119_publisher_11":{"attribute_name":"出版者名","attribute_value_mlt":[{"subitem_publisher":"社団法人照明学会"}]},"item_119_source_id_14":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00192341","subitem_source_identifier_type":"ISSN"}]},"item_119_text_3":{"attribute_name":"著者 ローマ字","attribute_value_mlt":[{"subitem_text_value":"Nakagawa, Yasuo"},{"subitem_text_value":"Ohkubo, Kazuaki"},{"subitem_text_value":"Sato, Yukihiro"},{"subitem_text_value":"Kohmoto, Kohtaro"},{"subitem_text_value":"Hoshiba, Yoshihiro"},{"subitem_text_value":"Tozawa, Hitoshi"}]},"item_119_text_32":{"attribute_name":"アイテムID","attribute_value_mlt":[{"subitem_text_value":"A1002190"}]},"item_119_text_4":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"埼玉大学名誉教授"},{"subitem_text_value":"松下電器産業株式会社"},{"subitem_text_value":"三共電気株式会社"},{"subitem_text_value":"東芝ライテック株式会社"},{"subitem_text_value":"岩崎電気株式会社"},{"subitem_text_value":"株式会社トプコン"}]},"item_119_text_5":{"attribute_name":"著者 所属(別言語)","attribute_value_mlt":[{"subitem_text_value":"Professors emeritus, Saitama University"},{"subitem_text_value":"Matsushita Electric Industrial Co., Ltd."},{"subitem_text_value":"Sankyo Denki Co., Ltd."},{"subitem_text_value":"Toshiba Lighting & Technology Corp."},{"subitem_text_value":"Iwasaki Electric CO., LTD."},{"subitem_text_value":"TOPCON Corp."}]},"item_119_text_9":{"attribute_name":"年月次","attribute_value_mlt":[{"subitem_text_value":"1999-2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"中川, 靖夫"},{"creatorName":"ナカガワ, ヤスオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"大久保, 和明"},{"creatorName":"オオクボ, カズアキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"佐藤, 幸広"},{"creatorName":"サトウ, ユキヒロ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"河本, 康太郎"},{"creatorName":"コウモト, コウタロウ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"干場, 芳洋"},{"creatorName":"ホシバ, ヨシヒロ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"戸沢, 均"},{"creatorName":"トザワ, ヒトシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-01-24"}],"displaytype":"detail","filename":"A1002190.pdf","filesize":[{"value":"833.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"A1002190.pdf","url":"https://sucra.repo.nii.ac.jp/record/12816/files/A1002190.pdf"},"version_id":"9c723874-c487-460b-b99a-b8b65b6a065e"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"253.7nm irradiance","subitem_subject_scheme":"Other"},{"subitem_subject":"spectral responsivity","subitem_subject_scheme":"Other"},{"subitem_subject":"thermal detector","subitem_subject_scheme":"Other"},{"subitem_subject":"silikon photodiode","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"253.7nm 放射照度測定値の国内比較","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"253.7nm 放射照度測定値の国内比較"}]},"item_type_id":"119","owner":"3","path":["426"],"pubdate":{"attribute_name":"公開日","attribute_value":"2007-09-18"},"publish_date":"2007-09-18","publish_status":"0","recid":"12816","relation_version_is_last":true,"title":["253.7nm 放射照度測定値の国内比較"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-05-16T12:49:43.460999+00:00"}