@article{oai:sucra.repo.nii.ac.jp:00012861,
 author = {HASHIMOTO, Toru and 小林, 禧夫},
 issue = {8},
 journal = {IEICE transactions on electronics},
 month = {},
 note = {The frequency dependence of surface resistance R_s of high temperature superconductor (HTS) films are measured by a novel measurement method using four TE_<0mp> modes in a sapphire rod resonator. At first, a loss tangent tan δ of the sapphire rod and R_s of the HTS films are evaluated separately from the results measured for the TE_<021> and TE_<012 >modes with close resonant frequencies. Secondly, R_s values at two different resonant frequencies for the TE_<011> and TE_<022> modes are measured using a well-known relation for sapphire tan δ/f = constant, where f is a frequency. R_s values of HoBa_2Cu_3O_<7-x> thin films were measured in the frequency range of 10 to 43 GHz by using four sapphire rod resonators with different sizes. As a result, it is found that these measured results of R_s have a characteristic of frequency square., copyright(c)2003 IEICE
許諾番号：07RB0174　
http://www.ieice.org/jpn/trans_online/index.html, text, application/pdf},
 pages = {1721--1728},
 title = {Frequency Dependence Measurements of Surface Resistance of Superconductors Using Four Modes in a Sapphire Rod Resonator(Special Issue on Microwave and Millimeter Wave Technology)},
 volume = {E86-C},
 year = {2003},
 yomi = {ハシモト, トオル and コバヤシ, ヨシオ}
}