{"created":"2023-05-15T15:25:18.073325+00:00","id":12877,"links":{},"metadata":{"_buckets":{"deposit":"5c784948-415c-4ea8-9dfa-57e993827e08"},"_deposit":{"created_by":3,"id":"12877","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"12877"},"status":"published"},"_oai":{"id":"oai:sucra.repo.nii.ac.jp:00012877","sets":["94:426"]},"author_link":["20303","20302"],"item_119_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"680","bibliographicPageStart":"672","bibliographicVolumeNumber":"E87-C","bibliographic_titles":[{"bibliographic_title":"IEICE transactions on electronics"}]}]},"item_119_date_31":{"attribute_name":"作成日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2007-10-04","subitem_date_issued_type":"Created"}]},"item_119_description_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_description":"http://www.ieice.org/jpn/trans_online/index.html | http://www.ieice.org/jpn/trans_online/index.html","subitem_description_type":"Other"}]},"item_119_description_19":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A novel resonator structure for the cut-off circular waveguide method is proposed to suppress the unwanted TE modes in the axial direction and TM modes in the radial direction. In this method, a dielectric plate sample is placed between two copper circular cylinders and clamped by two clips. The cylinder regions constitute the TE_<0m> mode cut-off waveguides. The measurement principle is based on a rigorous analysis by the Ritz-Galerkin method. Many resonance modes observed in the measurement can be identified effectively by mode charts. In order to verify the validity of the novel structure for this method, the temperature dependences for three low-loss organic material plates were measured in the frequency range 40 to 50 GHz. It is found that modified polyolefin plates have comparable electric characteristics and low price, compared with PTFE plates. Moreover, it is verified that the novel resonator structure is effective in improvement of accuracy and stability in measurement. The measurement precisions are estimated within 1 percent for ε_r and within 15 percent for tan δ.","subitem_description_type":"Abstract"}]},"item_119_description_21":{"attribute_name":"注記","attribute_value_mlt":[{"subitem_description":"copyright(c)2004 IEICE\n許諾番号：07RB0174","subitem_description_type":"Other"}]},"item_119_description_29":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"text","subitem_description_type":"Other"}]},"item_119_description_30":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_119_publisher_11":{"attribute_name":"出版者名","attribute_value_mlt":[{"subitem_publisher":"社団法人電子情報通信学会"}]},"item_119_source_id_14":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09168516","subitem_source_identifier_type":"ISSN"}]},"item_119_text_3":{"attribute_name":"著者 ローマ字","attribute_value_mlt":[{"subitem_text_value":"SHIMIZU, Takashi"},{"subitem_text_value":"KOBAYASHI, Yoshio"}]},"item_119_text_32":{"attribute_name":"アイテムID","attribute_value_mlt":[{"subitem_text_value":"A1003044"}]},"item_119_text_4":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"埼玉大学"},{"subitem_text_value":"埼玉大学"}]},"item_119_text_5":{"attribute_name":"著者 所属(別言語)","attribute_value_mlt":[{"subitem_text_value":"Saitama University"},{"subitem_text_value":"Saitama University"}]},"item_119_text_9":{"attribute_name":"年月次","attribute_value_mlt":[{"subitem_text_value":"2004-5"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"SHIMIZU, Takashi"},{"creatorName":"シミズ, タカシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小林, 禧夫"},{"creatorName":"コバヤシ, ヨシオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-01-24"}],"displaytype":"detail","filename":"A1003044.pdf","filesize":[{"value":"1.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"A1003044.pdf","url":"https://sucra.repo.nii.ac.jp/record/12877/files/A1003044.pdf"},"version_id":"8a6266da-b4be-4c52-acbe-9adf8752642a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"cut-off circular waveguide method","subitem_subject_scheme":"Other"},{"subitem_subject":"millimeter wave","subitem_subject_scheme":"Other"},{"subitem_subject":"dielectric substrate measurement","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Cut-Off Circular Waveguide Method for Dielectric Substrate Measurements in Millimeter Wave Range(General Methods, Materials, and Passive Circuits)(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Cut-Off Circular Waveguide Method for Dielectric Substrate Measurements in Millimeter Wave Range(General Methods, Materials, and Passive Circuits)(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)"}]},"item_type_id":"119","owner":"3","path":["426"],"pubdate":{"attribute_name":"公開日","attribute_value":"2007-10-04"},"publish_date":"2007-10-04","publish_status":"0","recid":"12877","relation_version_is_last":true,"title":["Cut-Off Circular Waveguide Method for Dielectric Substrate Measurements in Millimeter Wave Range(General Methods, Materials, and Passive Circuits)(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T19:36:20.170349+00:00"}