@article{oai:sucra.repo.nii.ac.jp:00012879,
 author = {小林, 禧夫},
 issue = {5},
 journal = {IEICE transactions on electronics},
 month = {},
 note = {http://www.ieice.org/jpn/trans_online/index.html | http://www.ieice.org/jpn/trans_online/index.html, The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture super-conductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties., copyright(c)2004 IEICE
許諾番号：07RB0174, text, application/pdf},
 pages = {652--656},
 title = {Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)},
 volume = {E87-C},
 year = {2004},
 yomi = {コバヤシ, ヨシオ}
}