{"created":"2023-05-15T15:25:18.157291+00:00","id":12879,"links":{},"metadata":{"_buckets":{"deposit":"ab3d65ae-bea4-444f-ad2b-14517b70dccb"},"_deposit":{"created_by":3,"id":"12879","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"12879"},"status":"published"},"_oai":{"id":"oai:sucra.repo.nii.ac.jp:00012879","sets":["94:426"]},"author_link":["20306"],"item_119_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"656","bibliographicPageStart":"652","bibliographicVolumeNumber":"E87-C","bibliographic_titles":[{"bibliographic_title":"IEICE transactions on electronics"}]}]},"item_119_date_31":{"attribute_name":"作成日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2007-10-04","subitem_date_issued_type":"Created"}]},"item_119_description_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_description":"http://www.ieice.org/jpn/trans_online/index.html | http://www.ieice.org/jpn/trans_online/index.html","subitem_description_type":"Other"}]},"item_119_description_19":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture super-conductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties.","subitem_description_type":"Abstract"}]},"item_119_description_21":{"attribute_name":"注記","attribute_value_mlt":[{"subitem_description":"copyright(c)2004 IEICE\n許諾番号：07RB0174","subitem_description_type":"Other"}]},"item_119_description_29":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"text","subitem_description_type":"Other"}]},"item_119_description_30":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_119_publisher_11":{"attribute_name":"出版者名","attribute_value_mlt":[{"subitem_publisher":"社団法人電子情報通信学会"}]},"item_119_source_id_14":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09168516","subitem_source_identifier_type":"ISSN"}]},"item_119_text_3":{"attribute_name":"著者 ローマ字","attribute_value_mlt":[{"subitem_text_value":"KOBAYASHI, Yoshio"}]},"item_119_text_32":{"attribute_name":"アイテムID","attribute_value_mlt":[{"subitem_text_value":"A1003046"}]},"item_119_text_4":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"埼玉大学"}]},"item_119_text_5":{"attribute_name":"著者 所属(別言語)","attribute_value_mlt":[{"subitem_text_value":"Saitama University"}]},"item_119_text_9":{"attribute_name":"年月次","attribute_value_mlt":[{"subitem_text_value":"2004-5"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"小林, 禧夫"},{"creatorName":"コバヤシ, ヨシオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-01-24"}],"displaytype":"detail","filename":"A1003046.pdf","filesize":[{"value":"464.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"A1003046.pdf","url":"https://sucra.repo.nii.ac.jp/record/12879/files/A1003046.pdf"},"version_id":"744bb916-f080-4a3a-bb62-b30ee48dab58"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"microwave","subitem_subject_scheme":"Other"},{"subitem_subject":"millimeter wave","subitem_subject_scheme":"Other"},{"subitem_subject":"standardization","subitem_subject_scheme":"Other"},{"subitem_subject":"low-loss dielectric","subitem_subject_scheme":"Other"},{"subitem_subject":"high-temperature superconductor","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)"}]},"item_type_id":"119","owner":"3","path":["426"],"pubdate":{"attribute_name":"公開日","attribute_value":"2007-10-04"},"publish_date":"2007-10-04","publish_status":"0","recid":"12879","relation_version_is_last":true,"title":["Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-05-16T12:47:21.331342+00:00"}