{"created":"2023-05-15T15:25:33.999311+00:00","id":13252,"links":{},"metadata":{"_buckets":{"deposit":"6e139848-9ccd-4715-b519-dc25f5c8e1ed"},"_deposit":{"created_by":3,"id":"13252","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"13252"},"status":"published"},"_oai":{"id":"oai:sucra.repo.nii.ac.jp:00013252","sets":["94:426"]},"author_link":["28812","21333","18430","21334"],"item_119_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9","bibliographicPageEnd":"1769","bibliographicPageStart":"1763","bibliographicVolumeNumber":"E90C","bibliographic_titles":[{"bibliographic_title":"IEICE TRANSACTIONS ON ELECTRONICS"}]}]},"item_119_date_31":{"attribute_name":"作成日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2008-05-13","subitem_date_issued_type":"Created"}]},"item_119_description_19":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Two-Thickness-Method (TTM) based on an open-ended coaxial probe was investigated with an emphasis on uncertainty analysis to perfect this technique. Uncertainty equations in differential forms are established for the simultaneous measurement of complex electromagnetic (EM) parameters in the systematical consideration of various error factors in measurement. Worst-case differential uncertainty equations were defined while the implicit partial derivation techniques were used to find the coefficients in formulation. The relations between the uncertainties and test sample's thicknesses were depicted via 3D figures, while the influence of the coaxial line's dimension on the measurement accuracy is also included based on the same analysis method. The comparisons between the measured errors and theoretical uncertainty prediction are given for several samples, which validate the effectiveness of our analysis.","subitem_description_type":"Abstract"}]},"item_119_description_21":{"attribute_name":"注記","attribute_value_mlt":[{"subitem_description":"copyright(c)2007 IEICE許諾番号：07R130209　http://search.ieice.org/index.html","subitem_description_type":"Other"}]},"item_119_description_29":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"text","subitem_description_type":"Other"}]},"item_119_description_30":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_119_publisher_11":{"attribute_name":"出版者名","attribute_value_mlt":[{"subitem_publisher":"社団法人電子情報通信学会"}]},"item_119_source_id_14":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09168524","subitem_source_identifier_type":"ISSN"}]},"item_119_text_27":{"attribute_name":"版","attribute_value_mlt":[{"subitem_text_value":"[出版社版]"}]},"item_119_text_3":{"attribute_name":"著者 ローマ字","attribute_value_mlt":[{"subitem_text_value":"Chen, Chun-Ping"},{"subitem_text_value":"Xu, Deming"},{"subitem_text_value":"Ma, Zhewang"},{"subitem_text_value":"Anada, Tetsuo"}]},"item_119_text_32":{"attribute_name":"アイテムID","attribute_value_mlt":[{"subitem_text_value":"A1002300"}]},"item_119_text_4":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"&EMPTY&"},{"subitem_text_value":"&EMPTY&"},{"subitem_text_value":"埼玉大学大学院理工学研究科数理電子情報部門"}]},"item_119_text_5":{"attribute_name":"著者 所属(別言語)","attribute_value_mlt":[{"subitem_text_value":"&EMPTY&"},{"subitem_text_value":"&EMPTY&"},{"subitem_text_value":"Graduate School of Science and Engineering, Saitama University"}]},"item_119_text_9":{"attribute_name":"年月次","attribute_value_mlt":[{"subitem_text_value":"2007-9"}]},"item_119_version_type_28":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Chen, Chun-Ping"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Xu, Deming"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"馬, 哲旺"},{"creatorName":"マ, テツオウ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Anada, Tetsuo"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-01-24"}],"displaytype":"detail","filename":"A1002300.pdf","filesize":[{"value":"2.8 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"A1002300.pdf","url":"https://sucra.repo.nii.ac.jp/record/13252/files/A1002300.pdf"},"version_id":"9e3f99a1-2bcf-4b05-bd39-1ecffec9c681"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"coaxial probe","subitem_subject_scheme":"Other"},{"subitem_subject":"two-thickness-method","subitem_subject_scheme":"Other"},{"subitem_subject":"absorbing material","subitem_subject_scheme":"Other"},{"subitem_subject":"EM-parameters","subitem_subject_scheme":"Other"},{"subitem_subject":"permittivity","subitem_subject_scheme":"Other"},{"subitem_subject":"permeability","subitem_subject_scheme":"Other"},{"subitem_subject":"uncertainty","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Further study on coaxial-probe-based two-thickness-method for nondestructive and broadband measurement of complex EM-parameters of absorbing material","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Further study on coaxial-probe-based two-thickness-method for nondestructive and broadband measurement of complex EM-parameters of absorbing material"}]},"item_type_id":"119","owner":"3","path":["426"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-05-13"},"publish_date":"2008-05-13","publish_status":"0","recid":"13252","relation_version_is_last":true,"title":["Further study on coaxial-probe-based two-thickness-method for nondestructive and broadband measurement of complex EM-parameters of absorbing material"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T19:18:10.853554+00:00"}