@article{oai:sucra.repo.nii.ac.jp:00013275,
 author = {Endo, Y. and 土方, 泰斗 and 矢口, 裕之 and Yoshida, S. and Yoshita, M. and Akiyama, H. and Nakajima, F. and Katayama, R. and Onabe, K.},
 issue = {6},
 journal = {PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES},
 month = {},
 note = {http://www.sciencedirect.com/science/journal/13869477 | http://www.sciencedirect.com/science/journal/13869477, We report on twin emission peaks observed from single isoelectronic traps formed by nitrogen pairs in nitrogen delta-doped GaAs by high-energy resolution micro-photoluminescence (PL) spectroscopy. The twin PL peaks show almost the same intensity with narrow linewidths of 20-50 mu eV, which are considerably smaller than that ever reported for isoelectronic traps in GaAs:N. The higher and lower energy luminescence transitions were linearly polarized in the [1 (1) over bar 0] and [1 1 0] directions, respectively, indicating that the two exciton states have completely orthogonal relations with each other. The fact that any pair of the twin PL peaks has the same polarization properties suggests that the splitting is due to the anisotropy between [1 (1) over bar 0] and [1 1 0] directions in the host crystal and is possibly explained by the strain anisotropy in the sample. (C) 2007 Elsevier B.V. All rights reserved., text, application/pdf},
 pages = {2110--2112},
 title = {Twin photoluminescence peaks from single isoelectronic traps in nitrogen delta-doped GaAs},
 volume = {40},
 year = {2008},
 yomi = {ヒジカタ, ヤスト and ヤグチ, ヒロユキ}
}