{"created":"2023-05-15T15:25:38.443717+00:00","id":13357,"links":{},"metadata":{"_buckets":{"deposit":"aa093c44-c6a9-468e-a3ef-adfebd2181a4"},"_deposit":{"created_by":3,"id":"13357","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"13357"},"status":"published"},"_oai":{"id":"oai:sucra.repo.nii.ac.jp:00013357","sets":["94:426"]},"author_link":["21656","21655","18303","21653","21654","16644"],"item_119_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"100","bibliographicPageStart":"97","bibliographic_titles":[{"bibliographic_title":"22nd International Symposium on Discharges and Electrical Insulation in Vacuum : ISDEIV"}]}]},"item_119_date_31":{"attribute_name":"作成日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2008-12-03","subitem_date_issued_type":"Created"}]},"item_119_description_19":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Secondary electron emission (SEE) coefficients of alumina ceramics with three different surface finishes have been measured using a scanning electron microscope with a single-pulse electron beam (100 pA, 1 ms). SEE coefficients of those aluminas with annealing process became lower after mechanical grinding operations even though its average roughness was almost same as those of as-sintered ones. SEE coefficients of mirror-finished samples were the smallest among the samples. Changes of SEE coefficient with incident angle of primary electrons for smooth and rough surfaces are also discussed","subitem_description_type":"Abstract"}]},"item_119_description_21":{"attribute_name":"注記","attribute_value_mlt":[{"subitem_description":"2008年9月ルーマニア・ブカレスト開催　第23回ISDEIV『最優秀論文賞』受賞論文\nJapan Prize-Best Paper Award","subitem_description_type":"Other"}]},"item_119_description_29":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"text","subitem_description_type":"Other"}]},"item_119_description_30":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_119_publisher_11":{"attribute_name":"出版者名","attribute_value_mlt":[{"subitem_publisher":"IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC"}]},"item_119_relation_16":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/DEIV.2006.357240","subitem_relation_type_select":"DOI"}}]},"item_119_source_id_14":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"10932941","subitem_source_identifier_type":"ISSN"}]},"item_119_text_27":{"attribute_name":"版","attribute_value_mlt":[{"subitem_text_value":"[出版社版]"}]},"item_119_text_3":{"attribute_name":"著者 ローマ字","attribute_value_mlt":[{"subitem_text_value":"Suharyanto"},{"subitem_text_value":"Michizono, Shinichiro"},{"subitem_text_value":"Saito, Yoshio"},{"subitem_text_value":"Tumiran"},{"subitem_text_value":"Yamano, Yasushi"},{"subitem_text_value":"Kobayashi, Shin'Ichi"}]},"item_119_text_32":{"attribute_name":"アイテムID","attribute_value_mlt":[{"subitem_text_value":"A1002803"}]},"item_119_text_4":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"埼玉大学大学院理工学研究科数理電子情報部門"},{"subitem_text_value":"&EMPTY&"},{"subitem_text_value":"&EMPTY&"},{"subitem_text_value":"&EMPTY&"},{"subitem_text_value":"埼玉大学大学院理工学研究科数理電子情報部門"},{"subitem_text_value":"埼玉大学大学院理工学研究科数理電子情報部門"}]},"item_119_text_5":{"attribute_name":"著者 所属(別言語)","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical and Electronic Systems, Saitama University(Present : Department of Electrical Engineering, Gadjah Mada University)"},{"subitem_text_value":"High Energy Accelerator Research Organization (KEK)"},{"subitem_text_value":"High Energy Accelerator Research Organization (KEK)"},{"subitem_text_value":"Department of Electrical Engineering, Gadjah Mada University"},{"subitem_text_value":"Department of Electrical and Electronic Systems, Saitama University"},{"subitem_text_value":"Department of Electrical and Electronic Systems, Saitama University"}]},"item_119_text_9":{"attribute_name":"年月次","attribute_value_mlt":[{"subitem_text_value":"2006-9"}]},"item_119_version_type_28":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Suhar, yanto"},{"creatorName":"スハルヤント","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"21653","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Michizono, Shinichiro"}],"nameIdentifiers":[{"nameIdentifier":"21654","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saito, Yoshio"}],"nameIdentifiers":[{"nameIdentifier":"21655","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tumiran"}],"nameIdentifiers":[{"nameIdentifier":"21656","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山納, 康"},{"creatorName":"ヤマノウ, ヤスシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"18303","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"aZMmsNBx","nameIdentifierScheme":"研究者総覧","nameIdentifierURI":"http://s-read.saitama-u.ac.jp/researchers/pages/researcher/aZMmsNBx"}]},{"creatorNames":[{"creatorName":"小林, 信一"},{"creatorName":"コバヤシ, シンイチ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"16644","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"dZBesZBx","nameIdentifierScheme":"研究者総覧","nameIdentifierURI":"http://s-read.saitama-u.ac.jp/researchers/pages/researcher/dZBesZBx"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-01-24"}],"displaytype":"detail","filename":"A1002803.pdf","filesize":[{"value":"689.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"A1002803.pdf","url":"https://sucra.repo.nii.ac.jp/record/13357/files/A1002803.pdf"},"version_id":"09f46d34-96ba-4eab-88f1-87c9637c3f4d"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Influence of Mechanical Finishing on Secondary Electron Emission of Alumina Ceramics","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Influence of Mechanical Finishing on Secondary Electron Emission of Alumina Ceramics"}]},"item_type_id":"119","owner":"3","path":["426"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-12-03"},"publish_date":"2008-12-03","publish_status":"0","recid":"13357","relation_version_is_last":true,"title":["Influence of Mechanical Finishing on Secondary Electron Emission of Alumina Ceramics"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T19:15:23.550382+00:00"}