{"created":"2023-05-15T15:26:32.611665+00:00","id":14584,"links":{},"metadata":{"_buckets":{"deposit":"61a7a4b3-c2a6-4845-befd-fdf7a8000c0c"},"_deposit":{"created_by":3,"id":"14584","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"14584"},"status":"published"},"_oai":{"id":"oai:sucra.repo.nii.ac.jp:00014584","sets":["95:240:476"]},"author_link":["16644"],"item_120_alternative_title_1":{"attribute_name":"タイトル（別言語）","attribute_value_mlt":[{"subitem_alternative_title":"Electrical Breakdown in Vacuum and Electrode Surface Condition : In situ electrode surface analysis and breakdown measurements"}]},"item_120_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"29","bibliographicPageStart":"22","bibliographicVolumeNumber":"3","bibliographic_titles":[{"bibliographic_title":"CACS FORUM"}]}]},"item_120_date_31":{"attribute_name":"作成日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2013-03-07","subitem_date_issued_type":"Created"}]},"item_120_description_19":{"attribute_name":"概要","attribute_value_mlt":[{"subitem_description":"Suppressing an electrical breakdown in vacuum (EBV) is one of principal factors to achieve higher performance and reliability of advanced facilities, such as space crafts, particle accelerators, vacuum interrupters, etc. It is regarded that the EBV is initiated by field electron emission from a cathode electrode. The field electron emission is a surface sensitive phenomenon. An in-house made facility to enable electrode surface analysis by X-ray Photoelectron Spectroscopy (XPS) and breakdown measurements under the same ultrahigh vacuum condition (10-7 to 10-8 Pa) was developed. Characteristics of breakdown field escalation of oxygen-free copper and titanium electrodes with the accumulation of repetitive breakdowns were investigated in conjunction with surface analysis. Test results were discussed on the basis of electrode surface conditions analyzed.","subitem_description_type":"Other"}]},"item_120_description_29":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"text","subitem_description_type":"Other"}]},"item_120_description_30":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_120_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24561/00014578","subitem_identifier_reg_type":"JaLC"}]},"item_120_publisher_11":{"attribute_name":"出版者名","attribute_value_mlt":[{"subitem_publisher":"埼玉大学研究機構科学分析支援センター"}]},"item_120_publisher_12":{"attribute_name":"出版者名（別言語）","attribute_value_mlt":[{"subitem_publisher":"Comprehensive Analysis Center for Science, Saitama University"}]},"item_120_text_27":{"attribute_name":"版","attribute_value_mlt":[{"subitem_text_value":"[出版社版]"}]},"item_120_text_3":{"attribute_name":"著者 ローマ字","attribute_value_mlt":[{"subitem_text_value":"KOBAYASHI, Shinichi"}]},"item_120_text_32":{"attribute_name":"アイテムID","attribute_value_mlt":[{"subitem_text_value":"KY-AA12504266-03-05"}]},"item_120_text_4":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"埼玉大学大学院理工学研究科数理電子情報部門"}]},"item_120_text_5":{"attribute_name":"著者 所属(別言語)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Science and Engineering, Saitama University"}]},"item_120_text_9":{"attribute_name":"年月次","attribute_value_mlt":[{"subitem_text_value":"2012-12"}]},"item_120_version_type_28":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"小林, 信一"},{"creatorName":"コバヤシ, シンイチ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-01-24"}],"displaytype":"detail","filename":"KY-AA12504266-03-05.pdf","filesize":[{"value":"1.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KY-AA12504266-03-05.pdf","url":"https://sucra.repo.nii.ac.jp/record/14584/files/KY-AA12504266-03-05.pdf"},"version_id":"d6811f1f-1084-4ae4-9ca0-c7f6ffa46410"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"真空中絶縁破壊現象と電極表面状態 : In situ電極表面分析・真空中絶縁破壊試験《マイレビュー》","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"真空中絶縁破壊現象と電極表面状態 : In situ電極表面分析・真空中絶縁破壊試験《マイレビュー》"}]},"item_type_id":"120","owner":"3","path":["476"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-03-08"},"publish_date":"2013-03-08","publish_status":"0","recid":"14584","relation_version_is_last":true,"title":["真空中絶縁破壊現象と電極表面状態 : In situ電極表面分析・真空中絶縁破壊試験《マイレビュー》"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-05-15T18:26:25.910058+00:00"}