{"created":"2023-05-15T15:27:42.536709+00:00","id":16621,"links":{},"metadata":{"_buckets":{"deposit":"e3188224-6eae-4944-a90d-f08c93f88833"},"_deposit":{"created_by":3,"id":"16621","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"16621"},"status":"published"},"_oai":{"id":"oai:sucra.repo.nii.ac.jp:00016621","sets":["95:239:634"]},"author_link":["27071","27070","27075","27074","27073","27072"],"item_120_alternative_title_1":{"attribute_name":"タイトル（別言語）","attribute_value_mlt":[{"subitem_alternative_title":"Subtraction and addition method for phase analysis of dynamic ESPI"}]},"item_120_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"59","bibliographicPageStart":"55","bibliographicVolumeNumber":"2","bibliographic_titles":[{"bibliographic_title":"埼玉大学地域共同研究センター紀要"},{"bibliographic_title":"Report of Cooperative Research Center, Saitama University","bibliographic_titleLang":"en"}]}]},"item_120_date_31":{"attribute_name":"作成日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2006-06-18","subitem_date_issued_type":"Created"}]},"item_120_description_19":{"attribute_name":"概要","attribute_value_mlt":[{"subitem_description":"Electronic Speckle Pattern Interferometry (ESPI) has been developed to make possible to observe dynamic feature of deformation in Dynamic ESPI (DESPI). In DESPI for phase analysis, conventional phase shifting method cannot be applied. We have proposed alternative method, subtraction and addition method in which phase variation may be deduced only by sequential speckle data without any additional data. In this paper, DESPI is applied to measure entire process of tensile experiment of an aluminum alloy sample. Propagation of strain localized band was clearly analyzed. Accuracy of phase analysis is estimated to be about 2π/10.","subitem_description_type":"Other"}]},"item_120_description_29":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"text","subitem_description_type":"Other"}]},"item_120_description_30":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_120_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24561/00016615","subitem_identifier_reg_type":"JaLC"}]},"item_120_publisher_11":{"attribute_name":"出版者名","attribute_value_mlt":[{"subitem_publisher":"埼玉大学地域共同研究センター"}]},"item_120_source_id_14":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13474758","subitem_source_identifier_type":"ISSN"}]},"item_120_text_3":{"attribute_name":"著者 ローマ字","attribute_value_mlt":[{"subitem_text_value":"S. Toyooka"},{"subitem_text_value":"H. Kadono"},{"subitem_text_value":"V. Madjarova"},{"subitem_text_value":"S. Matsuda"},{"subitem_text_value":"T. Saito"},{"subitem_text_value":"P. Sun"}]},"item_120_text_32":{"attribute_name":"アイテムID","attribute_value_mlt":[{"subitem_text_value":"KY-AA11808968-02-15"}]},"item_120_text_4":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"埼玉大学大学院理工学研究科環境制御工学専攻"},{"subitem_text_value":"埼玉大学大学院理工学研究科環境制御工学専攻"},{"subitem_text_value":"埼玉大学大学院理工学研究科環境制御工学専攻"},{"subitem_text_value":"埼玉大学地域共同研究センター"},{"subitem_text_value":"富士写真光機株式会社"},{"subitem_text_value":"富士写真光機株式会社"}]},"item_120_text_5":{"attribute_name":"著者 所属(別言語)","attribute_value_mlt":[{"subitem_text_value":"Department of Environmental Science and Human Engineering, Saitama Universiy"},{"subitem_text_value":"Department of Environmental Science and Human Engineering, Saitama Universiy"},{"subitem_text_value":"Department of Environmental Science and Human Engineering, Saitama Universiy"},{"subitem_text_value":"Cooperative Research Center, Saitama University"},{"subitem_text_value":"Fuji Photo Optical CO., LTD"},{"subitem_text_value":"Fuji Photo Optical CO., LTD"}]},"item_120_text_9":{"attribute_name":"年月次","attribute_value_mlt":[{"subitem_text_value":"2001"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"豊岡, 了"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"門野, 博史"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"マジャロバ・, ヴィオレッタ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松田, 信一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"斉藤, 隆行"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"孫, 萍"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-01-24"}],"displaytype":"detail","filename":"KY-AA11808968-02-15.pdf","filesize":[{"value":"348.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KY-AA11808968-02-15.pdf","url":"https://sucra.repo.nii.ac.jp/record/16621/files/KY-AA11808968-02-15.pdf"},"version_id":"c3dc784d-9da3-420a-aa66-ac474e375276"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"dynamic ESPI","subitem_subject_scheme":"Other"},{"subitem_subject":"phase analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"subtraction and addition method","subitem_subject_scheme":"Other"},{"subitem_subject":"plastic deformation","subitem_subject_scheme":"Other"},{"subitem_subject":"strainlocalized band","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"動的ESPIの和差法による高精度位相解析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"動的ESPIの和差法による高精度位相解析"}]},"item_type_id":"120","owner":"3","path":["634"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-06-02"},"publish_date":"2009-06-02","publish_status":"0","recid":"16621","relation_version_is_last":true,"title":["動的ESPIの和差法による高精度位相解析"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-05-15T18:15:40.672255+00:00"}