{"created":"2023-05-15T15:27:51.196288+00:00","id":16826,"links":{},"metadata":{"_buckets":{"deposit":"6c486382-44f5-4dfb-ad1d-80ac4fbd1344"},"_deposit":{"created_by":3,"id":"16826","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"16826"},"status":"published"},"_oai":{"id":"oai:sucra.repo.nii.ac.jp:00016826","sets":["95:239:640"]},"author_link":["27634","16477","27633"],"item_120_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"35","bibliographicPageStart":"32","bibliographicVolumeNumber":"8","bibliographic_titles":[{"bibliographic_title":"埼玉大学地域共同研究センター紀要"},{"bibliographic_title":"Report of Cooperative Research Center, Saitama University","bibliographic_titleLang":"en"}]}]},"item_120_date_31":{"attribute_name":"作成日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2009-02-26","subitem_date_issued_type":"Created"}]},"item_120_description_19":{"attribute_name":"概要","attribute_value_mlt":[{"subitem_description":"We have carried out the dielectric function analysis of SmHｘ(x=2.28, 2.42, 2.56, 2.57) films based on the room-temperature reflectance spectra for photon energies ranging form 0.05 to 6.5 eV. The analysis has been performed by using i) the model dielectric functions and ii) Kramers-Kronig analysis to obtain the real and imaginary parts of the dielectric constants in SmHｘ. The both approaches demonstrate that the interband transition energy shows a red shift of about 1 eV when H/Sm ratio is increased from 2.28 to 2.57, though the lattice constant remains almost unchanged.","subitem_description_type":"Other"}]},"item_120_description_29":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"text","subitem_description_type":"Other"}]},"item_120_description_30":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_120_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24561/00016820","subitem_identifier_reg_type":"JaLC"}]},"item_120_publisher_11":{"attribute_name":"出版者名","attribute_value_mlt":[{"subitem_publisher":"埼玉大学総合研究機構地域共同研究センター産学連携推進部門"}]},"item_120_source_id_14":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13474758","subitem_source_identifier_type":"ISSN"}]},"item_120_text_3":{"attribute_name":"著者 ローマ字","attribute_value_mlt":[{"subitem_text_value":"Sakai, Msamichi"},{"subitem_text_value":"Endo, Motoki"},{"subitem_text_value":"Nakamura, Osamu"}]},"item_120_text_32":{"attribute_name":"アイテムID","attribute_value_mlt":[{"subitem_text_value":"KY-AA11808968-08-12"}]},"item_120_text_4":{"attribute_name":"著者 所属","attribute_value_mlt":[{"subitem_text_value":"埼玉大学大学院理工学研究科物質科学部門"},{"subitem_text_value":"埼玉大学大学院理工学研究科物質科学部門"},{"subitem_text_value":"カシオ計算機要素技術統括部"}]},"item_120_text_5":{"attribute_name":"著者 所属(別言語)","attribute_value_mlt":[{"subitem_text_value":"Department of Functional Materials Science, Saitama University"},{"subitem_text_value":"Department of Functional Materials Science, Saitama University"},{"subitem_text_value":"Advanced Research Lab. Casio Computer"}]},"item_120_text_9":{"attribute_name":"年月次","attribute_value_mlt":[{"subitem_text_value":"2007"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"酒井, 政道"},{"creatorName":"サカイ, マサミチ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"16477","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"sZUekZhu","nameIdentifierScheme":"研究者総覧","nameIdentifierURI":"http://s-read.saitama-u.ac.jp/researchers/pages/researcher/sZUekZhu"}]},{"creatorNames":[{"creatorName":"遠藤, 元気"},{"creatorName":"エンドウ, モトキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"27633","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中村, 修"},{"creatorName":"ナカムラ, オサム","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"27634","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-01-24"}],"displaytype":"detail","filename":"KY-AA11808968-08-12.pdf","filesize":[{"value":"644.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KY-AA11808968-08-12.pdf","url":"https://sucra.repo.nii.ac.jp/record/16826/files/KY-AA11808968-08-12.pdf"},"version_id":"29953b72-c31b-4e9f-9625-3696eb12ca74"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"dielectric function","subitem_subject_scheme":"Other"},{"subitem_subject":"Kramers-Kronig analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"SmHx","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"遠赤外線領域の光学材料評価技術の開発 ： SmHＸ薄膜（2.2<x<2.6）における誘電関数評価への応用","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"遠赤外線領域の光学材料評価技術の開発 ： SmHＸ薄膜（2.2<x<2.6）における誘電関数評価への応用"}]},"item_type_id":"120","owner":"3","path":["640"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-02-25"},"publish_date":"2009-02-25","publish_status":"0","recid":"16826","relation_version_is_last":true,"title":["遠赤外線領域の光学材料評価技術の開発 ： SmHＸ薄膜（2.2<x<2.6）における誘電関数評価への応用"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-05-15T18:07:43.875916+00:00"}