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{"_buckets": {"deposit": "5e72a745-2052-4dd4-ba88-ba3022b38c0c"}, "_deposit": {"created_by": 3, "id": "12871", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "12871"}, "status": "published"}, "_oai": {"id": "oai:sucra.repo.nii.ac.jp:00012871", "sets": ["426"]}, "author_link": ["20293", "20292"], "item_119_biblio_info_8": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2004", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "5", "bibliographicPageEnd": "688", "bibliographicPageStart": "681", "bibliographicVolumeNumber": "E87-C", "bibliographic_titles": [{"bibliographic_title": "IEICE transactions on electronics"}]}]}, "item_119_date_31": {"attribute_name": "作成日", "attribute_value_mlt": [{"subitem_date_issued_datetime": "2007-10-04", "subitem_date_issued_type": "Created"}]}, "item_119_description_19": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Precise designs are presented for sapphire rod resonators of three types, which have been proposed by the IEC/TC90/WG8 in the standard measurement method of the surface resistance R_s of high-T_c superconductor (HTS) films; an open-type, a cavity-type and a closed-type. In order to separate TE_\u003c011\u003e and TE_\u003c013\u003e modes, which are used in Rs measurements, from the other modes, appropriate dimensions for these three resonators are determined from mode charts calculated from a rigorous analysis based on the mode matching method, taking account of an uniaxialanisotropic characteristic of sapphire. Comparison of the open-type resonator with the closed-type is performed. For the open-type, the unloaded Q values of both the TE_\u003c011\u003e and TE_\u003c013\u003e modes are reduced by radiations of a leaky state TM_\u003c310\u003e mode. Finally, validity of the design and a two-sapphirerod-resonator method will be verified by experiments.", "subitem_description_type": "Abstract"}]}, "item_119_description_21": {"attribute_name": "注記", "attribute_value_mlt": [{"subitem_description": "copyright(c)2004 IEICE\n許諾番号:07RB0174 \nhttp://www.ieice.org/jpn/trans_online/index.html", "subitem_description_type": "Other"}]}, "item_119_description_29": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"subitem_description": "text", "subitem_description_type": "Other"}]}, "item_119_description_30": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_description": "application/pdf", "subitem_description_type": "Other"}]}, "item_119_publisher_11": {"attribute_name": "出版者名", "attribute_value_mlt": [{"subitem_publisher": "社団法人電子情報通信学会"}]}, "item_119_source_id_14": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "09168516", "subitem_source_identifier_type": "ISSN"}]}, "item_119_text_3": {"attribute_name": "著者 ローマ字", "attribute_value_mlt": [{"subitem_text_value": "HASHIMOTO, Toru"}, {"subitem_text_value": "KOBAYASHI, Yoshio"}]}, "item_119_text_32": {"attribute_name": "アイテムID", "attribute_value_mlt": [{"subitem_text_value": "A1003039"}]}, "item_119_text_35": {"attribute_name": "公開日(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "Oct 4, 2007 09:00:00"}]}, "item_119_text_36": {"attribute_name": "最終更新日(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "Oct 11, 2008 06:15:01"}]}, "item_119_text_37": {"attribute_name": "更新履歴(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "Oct 11, 2008 タイトル, フリーキーワード, インデックス, キーワード を変更"}, {"subitem_text_value": "Feb 28, 2008 タイトル, フリーキーワード, インデックス, キーワード を変更"}, {"subitem_text_value": "Feb 14, 2008 タイトル, フリーキーワード, インデックス, キーワード を変更"}, {"subitem_text_value": "Oct 20, 2007 タイトル, フリーキーワード, インデックス, キーワード を変更"}, {"subitem_text_value": "Oct 12, 2007 タイトル, フリーキーワード, キーワード を変更"}, {"subitem_text_value": "Oct 5, 2007 コメント, ID, タイトル, フリーキーワード, インデックス, キーワード を変更"}]}, "item_119_text_38": {"attribute_name": "登録者(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "sucra_jim4"}]}, "item_119_text_39": {"attribute_name": "閲覧数(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "851"}]}, "item_119_text_4": {"attribute_name": "著者 所属", "attribute_value_mlt": [{"subitem_text_value": "埼玉大学"}, {"subitem_text_value": "埼玉大学"}]}, "item_119_text_40": {"attribute_name": "ダウンロード数(XooNIps)", "attribute_value_mlt": [{"subitem_text_value": "1016"}]}, "item_119_text_41": {"attribute_name": "XooNIps_インデックス", "attribute_value_mlt": [{"subitem_text_value": "sucra_jim4|Public/埼玉大学/理工学研究科|Public/埼玉大学/理工学研究科/数理電子情報部門|Public/主題別/工学/電気電子工学/電子・電気材料工学|Public/ジャンル別/学術雑誌論文(国内)/電子情報通信学会"}]}, "item_119_text_42": {"attribute_name": "XooNIps_ITEM_KEY", "attribute_value_mlt": [{"subitem_text_value": "823"}]}, "item_119_text_5": {"attribute_name": "著者 所属(別言語)", "attribute_value_mlt": [{"subitem_text_value": "Saitama University"}, {"subitem_text_value": "Saitama University"}]}, "item_119_text_9": {"attribute_name": "年月次", "attribute_value_mlt": [{"subitem_text_value": "2004-5"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "HASHIMOTO, Toru"}, {"creatorName": "ハシモト, トオル", "creatorNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "20292", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "小林, 禧夫"}, {"creatorName": "コバヤシ, ヨシオ", "creatorNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "20293", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-01-24"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "A1003039.pdf", "filesize": [{"value": "1.2 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1200000.0, "url": {"label": "A1003039.pdf", "url": "https://sucra.repo.nii.ac.jp/record/12871/files/A1003039.pdf"}, "version_id": "86563c59-99ad-4d84-9e0f-29b097a14b7e"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "two-sapphire-rod-resonator method", "subitem_subject_scheme": "Other"}, {"subitem_subject": "surface resistance", "subitem_subject_scheme": "Other"}, {"subitem_subject": "high-T_c superconductor", "subitem_subject_scheme": "Other"}, {"subitem_subject": "open-type", "subitem_subject_scheme": "Other"}, {"subitem_subject": "cavity-type", "subitem_subject_scheme": "Other"}, {"subitem_subject": "closed-type", "subitem_subject_scheme": "Other"}, {"subitem_subject": "mode chart", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Two-Sapphire-Rod-Resonator Method to Measure the Surface Resistance of High-T_c Superconductor Films(General Methods, Materials, and Passive Circuits)(\u003cSpecial Section\u003eAdvances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Two-Sapphire-Rod-Resonator Method to Measure the Surface Resistance of High-T_c Superconductor Films(General Methods, Materials, and Passive Circuits)(\u003cSpecial Section\u003eAdvances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)"}]}, "item_type_id": "119", "owner": "3", "path": ["426"], "permalink_uri": "https://sucra.repo.nii.ac.jp/records/12871", "pubdate": {"attribute_name": "公開日", "attribute_value": "2007-10-04"}, "publish_date": "2007-10-04", "publish_status": "0", "recid": "12871", "relation": {}, "relation_version_is_last": true, "title": ["Two-Sapphire-Rod-Resonator Method to Measure the Surface Resistance of High-T_c Superconductor Films(General Methods, Materials, and Passive Circuits)(\u003cSpecial Section\u003eAdvances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)"], "weko_shared_id": 3}
Two-Sapphire-Rod-Resonator Method to Measure the Surface Resistance of High-T_c Superconductor Films(General Methods, Materials, and Passive Circuits)(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
https://sucra.repo.nii.ac.jp/records/12871
https://sucra.repo.nii.ac.jp/records/1287149e76a29-9f77-41c9-aefd-8b5c15631da7
名前 / ファイル | ライセンス | アクション |
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A1003039.pdf (1.2 MB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2007-10-04 | |||||
タイトル | ||||||
タイトル | Two-Sapphire-Rod-Resonator Method to Measure the Surface Resistance of High-T_c Superconductor Films(General Methods, Materials, and Passive Circuits)(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits) | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | two-sapphire-rod-resonator method | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | surface resistance | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | high-T_c superconductor | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | open-type | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | cavity-type | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | closed-type | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | mode chart | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
HASHIMOTO, Toru
× HASHIMOTO, Toru× 小林, 禧夫 |
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著者 ローマ字 | ||||||
HASHIMOTO, Toru | ||||||
著者 ローマ字 | ||||||
KOBAYASHI, Yoshio | ||||||
著者 所属 | ||||||
埼玉大学 | ||||||
著者 所属 | ||||||
埼玉大学 | ||||||
著者 所属(別言語) | ||||||
Saitama University | ||||||
著者 所属(別言語) | ||||||
Saitama University | ||||||
書誌情報 |
IEICE transactions on electronics 巻 E87-C, 号 5, p. 681-688, 発行日 2004 |
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年月次 | ||||||
2004-5 | ||||||
出版者名 | ||||||
出版者 | 社団法人電子情報通信学会 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 09168516 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Precise designs are presented for sapphire rod resonators of three types, which have been proposed by the IEC/TC90/WG8 in the standard measurement method of the surface resistance R_s of high-T_c superconductor (HTS) films; an open-type, a cavity-type and a closed-type. In order to separate TE_<011> and TE_<013> modes, which are used in Rs measurements, from the other modes, appropriate dimensions for these three resonators are determined from mode charts calculated from a rigorous analysis based on the mode matching method, taking account of an uniaxialanisotropic characteristic of sapphire. Comparison of the open-type resonator with the closed-type is performed. For the open-type, the unloaded Q values of both the TE_<011> and TE_<013> modes are reduced by radiations of a leaky state TM_<310> mode. Finally, validity of the design and a two-sapphirerod-resonator method will be verified by experiments. | |||||
注記 | ||||||
内容記述タイプ | Other | |||||
内容記述 | copyright(c)2004 IEICE 許諾番号:07RB0174 http://www.ieice.org/jpn/trans_online/index.html |
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資源タイプ | ||||||
内容記述タイプ | Other | |||||
内容記述 | text | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
作成日 | ||||||
日付 | 2007-10-04 | |||||
日付タイプ | Created | |||||
アイテムID | ||||||
A1003039 |