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Influence of Mechanical Finishing on Secondary Electron Emission of Alumina Ceramics
https://sucra.repo.nii.ac.jp/records/13357
https://sucra.repo.nii.ac.jp/records/13357a5973acf-0ba1-43bf-bec4-c8ce1176990e
名前 / ファイル | ライセンス | アクション |
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A1002803.pdf (689.2 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2008-12-03 | |||||
タイトル | ||||||
タイトル | Influence of Mechanical Finishing on Secondary Electron Emission of Alumina Ceramics | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Suhar, yanto
× Suhar, yanto× Michizono, Shinichiro× Saito, Yoshio× Tumiran× 山納, 康× 小林, 信一 |
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著者 ローマ字 | ||||||
Suharyanto | ||||||
著者 ローマ字 | ||||||
Michizono, Shinichiro | ||||||
著者 ローマ字 | ||||||
Saito, Yoshio | ||||||
著者 ローマ字 | ||||||
Tumiran | ||||||
著者 ローマ字 | ||||||
Yamano, Yasushi | ||||||
著者 ローマ字 | ||||||
Kobayashi, Shin'Ichi | ||||||
著者 所属 | ||||||
埼玉大学大学院理工学研究科数理電子情報部門 | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
著者 所属 | ||||||
埼玉大学大学院理工学研究科数理電子情報部門 | ||||||
著者 所属 | ||||||
埼玉大学大学院理工学研究科数理電子情報部門 | ||||||
著者 所属(別言語) | ||||||
Department of Electrical and Electronic Systems, Saitama University(Present : Department of Electrical Engineering, Gadjah Mada University) | ||||||
著者 所属(別言語) | ||||||
High Energy Accelerator Research Organization (KEK) | ||||||
著者 所属(別言語) | ||||||
High Energy Accelerator Research Organization (KEK) | ||||||
著者 所属(別言語) | ||||||
Department of Electrical Engineering, Gadjah Mada University | ||||||
著者 所属(別言語) | ||||||
Department of Electrical and Electronic Systems, Saitama University | ||||||
著者 所属(別言語) | ||||||
Department of Electrical and Electronic Systems, Saitama University | ||||||
書誌情報 |
22nd International Symposium on Discharges and Electrical Insulation in Vacuum : ISDEIV p. 97-100, 発行日 2006 |
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年月次 | ||||||
2006-9 | ||||||
出版者名 | ||||||
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 10932941 | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | info:doi/10.1109/DEIV.2006.357240 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Secondary electron emission (SEE) coefficients of alumina ceramics with three different surface finishes have been measured using a scanning electron microscope with a single-pulse electron beam (100 pA, 1 ms). SEE coefficients of those aluminas with annealing process became lower after mechanical grinding operations even though its average roughness was almost same as those of as-sintered ones. SEE coefficients of mirror-finished samples were the smallest among the samples. Changes of SEE coefficient with incident angle of primary electrons for smooth and rough surfaces are also discussed | |||||
注記 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 2008年9月ルーマニア・ブカレスト開催 第23回ISDEIV『最優秀論文賞』受賞論文 Japan Prize-Best Paper Award |
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版 | ||||||
[出版社版] | ||||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
資源タイプ | ||||||
内容記述タイプ | Other | |||||
内容記述 | text | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
作成日 | ||||||
日付 | 2008-12-03 | |||||
日付タイプ | Created | |||||
アイテムID | ||||||
A1002803 |