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極低窒素濃度化合物半導体混晶におけるアイソエレクトロニックトラップによる発光に関する研究<研究成果報告>
https://doi.org/10.24561/00016126
https://doi.org/10.24561/00016126f438405b-ff21-4b05-82a4-b2c3c6708a36
名前 / ファイル | ライセンス | アクション |
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2008-03-21 | |||||
タイトル | ||||||
タイトル | 極低窒素濃度化合物半導体混晶におけるアイソエレクトロニックトラップによる発光に関する研究<研究成果報告> | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | isoelectronic trap | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | dilute nitride semiconductor alloy | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | photoluminescence | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | GaAsN | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
ID登録 | ||||||
ID登録 | 10.24561/00016126 | |||||
ID登録タイプ | JaLC | |||||
タイトル(別言語) | ||||||
その他のタイトル | Photoluminescence from Isoelectronic Traps in Dilute Nitride Semiconductor Alloys | |||||
著者 |
矢口, 裕之
× 矢口, 裕之× 青木, 貴嗣 |
|||||
著者 ローマ字 | ||||||
YAGUCHI, Hiroyuki | ||||||
著者 ローマ字 | ||||||
AOKI, Takashi | ||||||
著者 所属 | ||||||
埼玉大学大学院理工学研究科数理電子情報部門 | ||||||
著者 所属(別言語) | ||||||
Graduate School of Science and Engineering, Saitama University | ||||||
書誌情報 |
埼玉大学紀要. 工学部 第1編 第1部 論文集 en : The Science and Engineering Reports of Saitama University 巻 39, p. 131-132, 発行日 2006 |
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年月次 | ||||||
2006-7 | ||||||
出版者名 | ||||||
出版者 | 埼玉大学工学部 | |||||
出版者名(別言語) | ||||||
出版者 | Faculty of Engineering, Saitama University | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 18804446 | |||||
概要 | ||||||
内容記述タイプ | Other | |||||
内容記述 | We have studied the photoluminescence from isoelectonic traps in dilute GaAsN alloys. A number of sharp luminescence peaks due to nitrogen pairs and their phonon replicas were observed. The energy differences between the luminescence peaks and phonon replicas were 36 meV, which is in agreement with the energy of the longitudinal optical phonon at the Γ point . This indicates that the formation of isoelectronic traps is largely affected by the conduction band state at the Γ point in dilute GaAsN alloys. We have also investigated the temperature dependence of the photoluminescence related to isoelectronic traps. The energy shift of the luminescence peaks with increasing temperature is found to be almost the same as that of E0 gap of GaAs, also showing that the conduction band state at the Γ point significantly contributes to the formation of isoelectronic traps in dilute GaAsN alloys. | |||||
その他の言語 | ||||||
言語 | eng | |||||
版 | ||||||
[出版社版] | ||||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
資源タイプ | ||||||
内容記述タイプ | Other | |||||
内容記述 | text | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
作成日 | ||||||
日付 | 2008-03-19 | |||||
日付タイプ | Created | |||||
アイテムID | ||||||
KY-AN00095842-39-23 |